Show simple item record

dc.contributor.authorDultsev, F. N.
dc.contributor.authorBaklanov, Mikhaïl
dc.date.accessioned2021-10-06T11:07:57Z
dc.date.available2021-10-06T11:07:57Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3440
dc.sourceIIOimport
dc.titleNondestructive determination of pore size distribution in thin films deposited on solid substrates
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage192
dc.source.endpage194
dc.source.journalElectrochemical and Solid State Letters
dc.source.issue4
dc.source.volume2
imec.availabilityPublished - open access


Files in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record