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Behavioural Models, Parameter Extraction and Yield Prediction for Silicon Photonic Circuits

dc.contributor.authorXing, Yufei
dc.date.accessioned2021-10-27T23:52:09Z
dc.date.available2021-10-27T23:52:09Z
dc.date.issued2019-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34470
dc.sourceIIOimport
dc.titleBehavioural Models, Parameter Extraction and Yield Prediction for Silicon Photonic Circuits
dc.typePHD thesis
dc.source.peerreviewno
dc.contributor.thesisadvisorVan Thourhout, Dries
dc.contributor.thesisadvisorDhaene, Tom
imec.availabilityPublished - imec


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