dc.contributor.author | Yoshida, Shinichi | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Suzuki, Rena | |
dc.contributor.author | Miyanami, Yuki | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Hosoi, Takuji | |
dc.contributor.author | Shimura, Takayoshi | |
dc.contributor.author | Watanabe, Heiji | |
dc.date.accessioned | 2021-10-28T00:08:32Z | |
dc.date.available | 2021-10-28T00:08:32Z | |
dc.date.issued | 2019 | |
dc.identifier.issn | 0021-4922 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34492 | |
dc.source | IIOimport | |
dc.title | Analysis of III-V oxides at high-k / InGaAs interfaces induced by metal electrodes | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 51010 | |
dc.source.journal | Japanese Journal of Applied Physics | |
dc.source.issue | 5 | |
dc.source.volume | 58 | |
dc.identifier.url | https://doi.org/10.7567/1347-4065/ab0256 | |
imec.availability | Published - open access | |