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Electrical Atomic Force Microscopy for Nanoelectronics

dc.contributor.editorCelano, Umberto
dc.date.accessioned2021-10-28T01:04:21Z
dc.date.available2021-10-28T01:04:21Z
dc.date.issued2019
dc.identifier.isbn978-3-030-15612-1
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34565
dc.sourceIIOimport
dc.titleElectrical Atomic Force Microscopy for Nanoelectronics
dc.typeBook
dc.source.peerreviewyes
dc.identifier.urlhttps://www.springer.com/gp/book/9783030156114
imec.availabilityPublished - imec


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