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Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in a HREM

dc.contributor.authorFedina, L.
dc.contributor.authorGutakovskii, A.
dc.contributor.authorAseev, A.
dc.contributor.authorVan Landuyt, J.
dc.contributor.authorVanhellemont, Jan
dc.date.accessioned2021-10-06T11:10:45Z
dc.date.available2021-10-06T11:10:45Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3456
dc.sourceIIOimport
dc.titleExtended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in a HREM
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage147
dc.source.endpage157
dc.source.journalPhysica Status Solidi A
dc.source.issue1
dc.source.volume171
imec.availabilityPublished - imec


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