dc.contributor.author | Acurio Mendez, Eliana | |
dc.contributor.author | Trojman, Lionel | |
dc.contributor.author | Crupi, Felice | |
dc.contributor.author | Moposita, | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2021-10-28T20:09:01Z | |
dc.date.available | 2021-10-28T20:09:01Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1530-4388 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34590 | |
dc.source | IIOimport | |
dc.title | Reliability assessment of AlGaN/GaN Schottky barrier diodes under ON-state stress | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 167 | |
dc.source.endpage | 171 | |
dc.source.journal | IEEE Transactions on Device and Materials Reliability | |
dc.source.issue | 1 | |
dc.source.volume | 20 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8970266 | |
imec.availability | Published - imec | |