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Keel-edge height selection for improved multi-pinhole 123I brain SPECT imaging

dc.contributor.authorAuer, Benjamin
dc.contributor.authorKalluri, Kesava
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorZeraatkar, Navid
dc.contributor.authorMomsen, Neil
dc.contributor.authorKuo, Philip H.
dc.contributor.authorFurenlid, Lars R.
dc.contributor.authorKing, Michael A.
dc.date.accessioned2021-10-28T20:11:45Z
dc.date.available2021-10-28T20:11:45Z
dc.date.issued2020-05
dc.identifier.issn0161-5505
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34660
dc.sourceIIOimport
dc.titleKeel-edge height selection for improved multi-pinhole 123I brain SPECT imaging
dc.typeJournal article
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.source.peerreviewyes
dc.source.beginpage573
dc.source.journalJournal of Nuclear Medicine
dc.source.issueSupll. 1
dc.source.volume61
dc.identifier.urlhttp://jnm.snmjournals.org/content/61/supplement_1/573.abstract
imec.availabilityPublished - imec


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