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Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges

dc.contributor.authorCelano, Umberto
dc.contributor.authorGomez, Andres
dc.contributor.authorPiedimonte, Paola
dc.contributor.authorNeumayer, Sabine
dc.contributor.authorCollins, Liam
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorFlorent, Karine
dc.contributor.authorMcMitchell, Sean
dc.contributor.authorFavia, Paola
dc.contributor.authorDrijbooms, Chris
dc.contributor.authorBender, Hugo
dc.contributor.authorParedis, Kristof
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorJesse, Stephen
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorvan der Heide, Paul
dc.date.accessioned2021-10-28T20:38:11Z
dc.date.available2021-10-28T20:38:11Z
dc.date.issued2020
dc.identifier.issn2079-4991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34874
dc.sourceIIOimport
dc.titleFerroelectricity in Si-doped hafnia: probing challenges in absence of screening charges
dc.typeJournal article
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorMcMitchell, Sean
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.source.peerreviewyes
dc.source.beginpage1576
dc.source.journalNanomaterials
dc.source.issue8
dc.source.volume10
dc.identifier.urlhttps://doi.org/10.3390/nano10081576
imec.availabilityPublished - imec


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