dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Croes, Kristof | |
dc.date.accessioned | 2021-10-28T20:45:07Z | |
dc.date.available | 2021-10-28T20:45:07Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34908 | |
dc.source | IIOimport | |
dc.title | Variability-aware predictive modeling of line-to-line dielectric reliability | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1737 | |
dc.source.endpage | 1744 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 4 | |
dc.source.volume | 67 | |
imec.availability | Published - imec | |