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Variability-aware predictive modeling of line-to-line dielectric reliability

dc.contributor.authorCiofi, Ivan
dc.contributor.authorRoussel, Philippe
dc.contributor.authorWilson, Chris
dc.contributor.authorCroes, Kristof
dc.date.accessioned2021-10-28T20:45:07Z
dc.date.available2021-10-28T20:45:07Z
dc.date.issued2020
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34908
dc.sourceIIOimport
dc.titleVariability-aware predictive modeling of line-to-line dielectric reliability
dc.typeJournal article
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorWilson, Chris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.source.peerreviewyes
dc.source.beginpage1737
dc.source.endpage1744
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue4
dc.source.volume67
imec.availabilityPublished - imec


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