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Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization

dc.contributor.authorCretu, Bogdan
dc.contributor.authorBoudier, Dimitri
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVeloso, Anabela
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-28T20:52:47Z
dc.date.available2021-10-28T20:52:47Z
dc.date.issued2020
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34941
dc.sourceIIOimport
dc.titleImproved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage107771
dc.source.journalSolid-State Electronics
dc.source.volume171
dc.identifier.urlhttps://doi.org/10.1016/j.sse.2020.107771
imec.availabilityPublished - imec


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