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Effect of sample preparation techniques upon single cell chemical imaging: A practical comparison between synchrotron radiation based X-ray fluorescence (SR-XRF) and Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS)

dc.contributor.authorDe Samber, Bjorn
dc.contributor.authorDe Rycke, Riet
dc.contributor.authorDe Bruyne, Michiel
dc.contributor.authorKienhuis, Michiel
dc.contributor.authorSandblad, Linda
dc.contributor.authorBohic, Sylvain
dc.contributor.authorCloetens, Peter
dc.contributor.authorUrban, Constantin
dc.contributor.authorPolerecky, Lubos
dc.contributor.authorVincze, Laszlo
dc.date.accessioned2021-10-28T21:06:21Z
dc.date.available2021-10-28T21:06:21Z
dc.date.issued2020-04
dc.identifier.issn0003-2670
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34998
dc.sourceIIOimport
dc.titleEffect of sample preparation techniques upon single cell chemical imaging: A practical comparison between synchrotron radiation based X-ray fluorescence (SR-XRF) and Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS)
dc.typeJournal article
dc.contributor.imecauthorDe Samber, Bjorn
dc.identifier.doi10.1016/j.aca.2020.01.054
dc.source.peerreviewyes
dc.source.beginpage22
dc.source.endpage32
dc.source.journalAnalytica Chimica Acta
dc.source.volume1106
imec.availabilityPublished - imec


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