dc.contributor.author | Doevenspeck, Jonas | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Debacker, Peter | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Lauwereins, Rudy | |
dc.contributor.author | Dehaene, Wim | |
dc.date.accessioned | 2021-10-28T21:24:03Z | |
dc.date.available | 2021-10-28T21:24:03Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35066 | |
dc.source | IIOimport | |
dc.title | Modeling and demonstration of oxygen vacancy-based RRAM as probabilistic device for sequence learning | |
dc.type | Journal article | |
dc.contributor.imecauthor | Doevenspeck, Jonas | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Debacker, Peter | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Lauwereins, Rudy | |
dc.contributor.imecauthor | Dehaene, Wim | |
dc.contributor.orcidimec | Debacker, Peter::0000-0003-3825-5554 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.contributor.orcidimec | Lauwereins, Rudy::0000-0002-3861-0168 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 505 | |
dc.source.endpage | 511 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 2 | |
dc.source.volume | 67 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8946878 | |
imec.availability | Published - imec | |