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Analysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processors

dc.contributor.authorDuch, Loris
dc.contributor.authorPeon-Quiros, Miguel
dc.contributor.authorWeckx, Pieter
dc.contributor.authorLevisse, Alex
dc.contributor.authorBraojos, Ruben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorAtienza, David
dc.date.accessioned2021-10-28T21:26:41Z
dc.date.available2021-10-28T21:26:41Z
dc.date.issued2020
dc.identifier.issn1063-8210
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35075
dc.sourceIIOimport
dc.titleAnalysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processors
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage2122
dc.source.endpage2133
dc.source.journalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.issue10
dc.source.volume28
imec.availabilityPublished - imec


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