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Analysis of gate-metal resistance in CMOS-compatible RF GaN HEMTs

dc.contributor.authorElKashlan, Rana Y.
dc.contributor.authorRodriguez, Raul
dc.contributor.authorYadav, Sachin
dc.contributor.authorKhaled, Ahmad
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorAlian, AliReza
dc.contributor.authorWaldron, Niamh
dc.contributor.authorZhao, Ming
dc.contributor.authorWambacq, Piet
dc.contributor.authorParvais, Bertrand
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-28T21:31:08Z
dc.date.available2021-10-28T21:31:08Z
dc.date.issued2020
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35090
dc.sourceIIOimport
dc.titleAnalysis of gate-metal resistance in CMOS-compatible RF GaN HEMTs
dc.typeJournal article
dc.contributor.imecauthorElKashlan, Rana Y.
dc.contributor.imecauthorRodriguez, Raul
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorKhaled, Ahmad
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecRodriguez, Raul::0000-0002-4457-8942
dc.contributor.orcidimecKhaled, Ahmad::0000-0003-2892-3176
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage4592
dc.source.endpage4596
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue11
dc.source.volume67
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9186848
imec.availabilityPublished - imec


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