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Intra-network interference robustness: An empirical evaluation of IEEE 802.15.4-2015 SUN-OFDM

dc.contributor.authorElsas, Robbe
dc.contributor.authorHoebeke, Jeroen
dc.contributor.authorVan Leemput, Dries
dc.contributor.authorShahid, Adnan
dc.contributor.authorDaneels, Glenn
dc.contributor.authorFamaey, Jeroen
dc.contributor.authorDe Poorter, Eli
dc.date.accessioned2021-10-28T21:32:37Z
dc.date.available2021-10-28T21:32:37Z
dc.date.issued2020
dc.identifier.issn2079-9292
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35095
dc.sourceIIOimport
dc.titleIntra-network interference robustness: An empirical evaluation of IEEE 802.15.4-2015 SUN-OFDM
dc.typeJournal article
dc.contributor.imecauthorElsas, Robbe
dc.contributor.imecauthorHoebeke, Jeroen
dc.contributor.imecauthorVan Leemput, Dries
dc.contributor.imecauthorShahid, Adnan
dc.contributor.imecauthorDaneels, Glenn
dc.contributor.imecauthorFamaey, Jeroen
dc.contributor.imecauthorDe Poorter, Eli
dc.contributor.orcidimecElsas, Robbe::0000-0002-4427-6987
dc.contributor.orcidimecHoebeke, Jeroen::0000-0003-2039-007X
dc.contributor.orcidimecVan Leemput, Dries::0000-0002-1910-8965
dc.contributor.orcidimecShahid, Adnan::0000-0003-1943-6261
dc.contributor.orcidimecDe Poorter, Eli::0000-0002-0214-5751
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1691
dc.source.journalElectronics
dc.source.issue10
dc.source.volume9
dc.identifier.urlhttps://doi.org/10.3390/electronics9101691
imec.availabilityPublished - open access


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