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Accelerated aging of InGaN/GaN LED by electrical stressing

dc.contributor.authorJacobs, Koen
dc.contributor.authorCheyns, Jan
dc.contributor.authorVan der Stricht, Wim
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorHarrison, I.
dc.date.accessioned2021-10-06T11:25:09Z
dc.date.available2021-10-06T11:25:09Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3531
dc.sourceIIOimport
dc.titleAccelerated aging of InGaN/GaN LED by electrical stressing
dc.typeMeeting abstract
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage120
dc.source.conference3rd International Conference on Nitride Semiconductors - ICNS3
dc.source.conferencedate04/07/1999
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


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