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dc.contributor.authorJonckheere, Rik
dc.contributor.authorRonse, Kurt
dc.contributor.authorWauters, Jan
dc.date.accessioned2021-10-06T11:27:38Z
dc.date.available2021-10-06T11:27:38Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3543
dc.sourceIIOimport
dc.titleSome challenges for mask making to keep up with the roadmap
dc.typeJournal article
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.imecauthorRonse, Kurt
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.contributor.orcidimecRonse, Kurt::0000-0003-0803-4267
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage229
dc.source.endpage233
dc.source.journalSemiconductor Fabtech
dc.source.volume10
imec.availabilityPublished - open access


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