dc.contributor.author | Jonckheere, Rik | |
dc.contributor.author | Ronse, Kurt | |
dc.contributor.author | Wauters, Jan | |
dc.date.accessioned | 2021-10-06T11:27:38Z | |
dc.date.available | 2021-10-06T11:27:38Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3543 | |
dc.source | IIOimport | |
dc.title | Some challenges for mask making to keep up with the roadmap | |
dc.type | Journal article | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.imecauthor | Ronse, Kurt | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.contributor.orcidimec | Ronse, Kurt::0000-0003-0803-4267 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 229 | |
dc.source.endpage | 233 | |
dc.source.journal | Semiconductor Fabtech | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |