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Reliability and integration of GaN power devices and circuits on GaN-on-Si

dc.contributor.authorLi, Xiangdong
dc.date.accessioned2021-10-28T23:55:24Z
dc.date.available2021-10-28T23:55:24Z
dc.date.issued2020-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35470
dc.sourceIIOimport
dc.titleReliability and integration of GaN power devices and circuits on GaN-on-Si
dc.typePHD thesis
dc.contributor.imecauthorLi, Xiangdong
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorGroeseneken, Guido
imec.availabilityPublished - open access


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