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Machine learning issues and opportunities in ultrafast particle classiication for label-free microflow cymetry

dc.contributor.authorLugnan, Alessio
dc.contributor.authorGooskens, Emmanuel
dc.contributor.authorVatin, Jeremy
dc.contributor.authorDambre, Joni
dc.contributor.authorBienstman, Peter
dc.date.accessioned2021-10-29T00:12:21Z
dc.date.available2021-10-29T00:12:21Z
dc.date.issued2020-11
dc.identifier.issn2045-2322
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35506
dc.sourceIIOimport
dc.titleMachine learning issues and opportunities in ultrafast particle classiication for label-free microflow cymetry
dc.typeJournal article
dc.contributor.imecauthorLugnan, Alessio
dc.contributor.imecauthorGooskens, Emmanuel
dc.contributor.imecauthorDambre, Joni
dc.contributor.imecauthorBienstman, Peter
dc.contributor.orcidimecLugnan, Alessio::0000-0002-6587-2614
dc.contributor.orcidimecGooskens, Emmanuel::0000-0003-3860-3563
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage20724
dc.source.journalNature Research
dc.source.issue1
dc.source.volume10
imec.availabilityPublished - open access
imec.internalnotes


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