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Surface contamination: A natural way towards high-resolution electric force microscopy in contact-resonant mode

dc.contributor.authorMinj, Albert
dc.contributor.authorSerron, Jill
dc.contributor.authorCelano, Umberto
dc.contributor.authorParedis, Kristof
dc.date.accessioned2021-10-29T00:50:12Z
dc.date.available2021-10-29T00:50:12Z
dc.date.issued2020
dc.identifier.issn1932-7447
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35586
dc.sourceIIOimport
dc.titleSurface contamination: A natural way towards high-resolution electric force microscopy in contact-resonant mode
dc.typeJournal article
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorSerron, Jill
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorParedis, Kristof
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecSerron, Jill::0000-0002-9101-8139
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewyes
dc.source.beginpage25331
dc.source.endpage25340
dc.source.journalJournal of Physical Chemistry C
dc.source.issue46
dc.source.volume124
dc.identifier.urlhttps://doi.org/10.1021/acs.jpcc.0c07639
imec.availabilityPublished - imec


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