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dc.contributor.authorNguyen, Van
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSanctorum, Jonathan
dc.contributor.authorVan Wassenbergh, S.
dc.contributor.authorBazrafkan, Shabab
dc.contributor.authorDirckx, J.J.J.
dc.contributor.authorSijbers, Jan
dc.date.accessioned2021-10-29T01:25:08Z
dc.date.available2021-10-29T01:25:08Z
dc.date.issued2020
dc.identifier.issn1058-9759
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35655
dc.sourceIIOimport
dc.titleA low-cost geometry calibration procedure for a modular cone-beam X-ray CT system
dc.typeJournal article
dc.contributor.imecauthorNguyen, Van
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSanctorum, Jonathan
dc.contributor.imecauthorBazrafkan, Shabab
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSanctorum, Jonathan::0000-0001-7968-4705
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage252
dc.source.endpage265
dc.source.journalNondestructive Testing and Evaluation
dc.source.issue3
dc.source.volume35
dc.identifier.urlhttps://doi.org/10.1080/10589759.2020.1774580
imec.availabilityPublished - imec


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