dc.contributor.author | Nguyen, Van | |
dc.contributor.author | De Beenhouwer, Jan | |
dc.contributor.author | Sanctorum, Jonathan | |
dc.contributor.author | Van Wassenbergh, S. | |
dc.contributor.author | Bazrafkan, Shabab | |
dc.contributor.author | Dirckx, J.J.J. | |
dc.contributor.author | Sijbers, Jan | |
dc.date.accessioned | 2021-10-29T01:25:08Z | |
dc.date.available | 2021-10-29T01:25:08Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1058-9759 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35655 | |
dc.source | IIOimport | |
dc.title | A low-cost geometry calibration procedure for a modular cone-beam X-ray CT system | |
dc.type | Journal article | |
dc.contributor.imecauthor | Nguyen, Van | |
dc.contributor.imecauthor | De Beenhouwer, Jan | |
dc.contributor.imecauthor | Sanctorum, Jonathan | |
dc.contributor.imecauthor | Bazrafkan, Shabab | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
dc.contributor.orcidimec | Sanctorum, Jonathan::0000-0001-7968-4705 | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 252 | |
dc.source.endpage | 265 | |
dc.source.journal | Nondestructive Testing and Evaluation | |
dc.source.issue | 3 | |
dc.source.volume | 35 | |
dc.identifier.url | https://doi.org/10.1080/10589759.2020.1774580 | |
imec.availability | Published - imec | |