dc.contributor.author | Nieves Avendano, Diego | |
dc.contributor.author | Caljouw, D. | |
dc.contributor.author | Deschrijver, Dirk | |
dc.contributor.author | Van Hoecke, Sofie | |
dc.date.accessioned | 2021-10-29T01:25:38Z | |
dc.date.available | 2021-10-29T01:25:38Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1433-3015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35656 | |
dc.source | IIOimport | |
dc.title | Anomaly detection and event mining in cold forming manufacturing processes | |
dc.type | Journal article | |
dc.contributor.imecauthor | Nieves Avendano, Diego | |
dc.contributor.imecauthor | Deschrijver, Dirk | |
dc.contributor.imecauthor | Van Hoecke, Sofie | |
dc.contributor.orcidimec | Nieves Avendano, Diego::0000-0001-6215-6439 | |
dc.contributor.orcidimec | Deschrijver, Dirk::0000-0001-6600-1792 | |
dc.contributor.orcidimec | Van Hoecke, Sofie::0000-0002-7865-6793 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 16 | |
dc.source.journal | International Journal of Advanced Manufacturing Technology | |
dc.identifier.url | https://doi.org/10.1007/s00170-020-06156-2 | |
imec.availability | Published - open access | |