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Low-frequency noise characterization of germanium n-channel finFETs

dc.contributor.authorOliveira, Alberto
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorBoccardi, Guillaume
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-29T01:32:16Z
dc.date.available2021-10-29T01:32:16Z
dc.date.issued2020
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35669
dc.sourceIIOimport
dc.titleLow-frequency noise characterization of germanium n-channel finFETs
dc.typeJournal article
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorBoccardi, Guillaume
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecBoccardi, Guillaume::0000-0003-3226-4572
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.identifier.doi10.1109/TED.2020.2990714
dc.source.peerreviewyes
dc.source.beginpage2872
dc.source.endpage2877
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue7
dc.source.volume67
imec.availabilityPublished - imec


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