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Nanoscale localisation of an atom probe tip through electric field mapping

dc.contributor.authorOp de Beeck, Jonathan
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorParedis, Kristof
dc.date.accessioned2021-10-29T01:37:24Z
dc.date.available2021-10-29T01:37:24Z
dc.date.issued2020
dc.identifier.issn1932-7447
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35679
dc.sourceIIOimport
dc.titleNanoscale localisation of an atom probe tip through electric field mapping
dc.typeJournal article
dc.contributor.imecauthorOp de Beeck, Jonathan
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorParedis, Kristof
dc.contributor.orcidimecOp de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewyes
dc.source.beginpage6371
dc.source.endpage6378
dc.source.journalJournal of Physical Chemistry C
dc.source.issue11
dc.source.volume124
dc.identifier.urlhttps://doi.org/10.1021/acs.jpcc.9b10194
imec.availabilityPublished - imec


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