Investigation of electrical properties of leading-edge sealed CBRAM devices using novel materials for future memory technologies
dc.contributor.author | Radhakrishnan, Janaki | |
dc.date.accessioned | 2021-10-29T02:34:38Z | |
dc.date.available | 2021-10-29T02:34:38Z | |
dc.date.issued | 2020-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35783 | |
dc.source | IIOimport | |
dc.title | Investigation of electrical properties of leading-edge sealed CBRAM devices using novel materials for future memory technologies | |
dc.type | PHD thesis | |
dc.contributor.imecauthor | Radhakrishnan, Janaki | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.contributor.thesisadvisor | Houssa, Michel | |
dc.contributor.thesisadvisor | Goux, Ludovic | |
imec.availability | Published - open access |