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The low-frequency noise overshoot in partially depleted N-channel silicon-on-insulator TWIN MOSTs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorSmeys, Peter
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T12:47:53Z
dc.date.available2021-09-29T12:47:53Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/357
dc.sourceIIOimport
dc.titleThe low-frequency noise overshoot in partially depleted N-channel silicon-on-insulator TWIN MOSTs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1972
dc.source.endpage1976
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume41
imec.availabilityPublished - imec


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