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Polarization dependence of pulsed laser-induced SEEs in SOI FinFETs

dc.contributor.authorRyder,
dc.contributor.authorRyder, Kaitlyn
dc.contributor.authorSternberg,
dc.contributor.authorKozub,
dc.contributor.authorGong,
dc.contributor.authorZhang,
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorWeller,
dc.contributor.authorSchrimpf,
dc.contributor.authorWeiss,
dc.contributor.authorReed,
dc.date.accessioned2021-10-29T03:20:24Z
dc.date.available2021-10-29T03:20:24Z
dc.date.issued2020
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35863
dc.sourceIIOimport
dc.titlePolarization dependence of pulsed laser-induced SEEs in SOI FinFETs
dc.typeJournal article
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.identifier.doi10.1109/TNS.2019.2956911
dc.source.peerreviewyes
dc.source.beginpage38
dc.source.endpage40
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue1
dc.source.volume67
imec.availabilityPublished - imec
imec.internalnotespaper from the 56th Annual IEEE International Nuclear and Space Radiation Effects Conference (IEEE NSREC)


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