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Synthesized view quality assessment using feature matching and superpixel difference

dc.contributor.authorSaeed, Mahmoudpour
dc.contributor.authorSchelkens, Peter
dc.date.accessioned2021-10-29T03:22:34Z
dc.date.available2021-10-29T03:22:34Z
dc.date.issued2020
dc.identifier.issn1070-9908
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35867
dc.sourceIIOimport
dc.titleSynthesized view quality assessment using feature matching and superpixel difference
dc.typeJournal article
dc.contributor.imecauthorSaeed, Mahmoudpour
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidimecSaeed, Mahmoudpour::0000-0003-1006-1838
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.source.peerreviewyes
dc.source.beginpage1650
dc.source.endpage1654
dc.source.journalIEEE Signal Processing Letters
dc.source.volume27
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9198131
imec.availabilityPublished - imec


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