dc.contributor.author | Srinivasan, Ashwyn | |
dc.contributor.author | Porret, Clément | |
dc.contributor.author | Vissers, Ewoud | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | De Coster, Jeroen | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Van Thourhout, Dries | |
dc.contributor.author | Van Campenhout, Joris | |
dc.contributor.author | Pantouvaki, Marianna | |
dc.date.accessioned | 2021-10-29T04:44:30Z | |
dc.date.available | 2021-10-29T04:44:30Z | |
dc.date.issued | 2020-02 | |
dc.identifier.issn | 0018-9197 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36007 | |
dc.source | IIOimport | |
dc.title | High absorption contrast quantum confined stark effect in ultra-thin Ge/SiGe quantum well stacks grown on si | |
dc.type | Journal article | |
dc.contributor.imecauthor | Srinivasan, Ashwyn | |
dc.contributor.imecauthor | Porret, Clément | |
dc.contributor.imecauthor | Vissers, Ewoud | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | De Coster, Jeroen | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Van Thourhout, Dries | |
dc.contributor.imecauthor | Van Campenhout, Joris | |
dc.contributor.imecauthor | Pantouvaki, Marianna | |
dc.contributor.orcidimec | Porret, Clément::0000-0002-4561-348X | |
dc.contributor.orcidimec | Vissers, Ewoud::0000-0002-5765-0552 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Van Thourhout, Dries::0000-0003-0111-431X | |
dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 5200207 | |
dc.source.journal | IEEE Journal of Quantum Electronics | |
dc.source.issue | 1 | |
dc.source.volume | 56 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8883247 | |
imec.availability | Published - open access | |
imec.internalnotes | | |