Show simple item record

Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors

dc.contributor.authorStockman, Arno
dc.date.accessioned2021-10-29T04:51:59Z
dc.date.available2021-10-29T04:51:59Z
dc.date.issued2020-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36020
dc.sourceIIOimport
dc.titleReliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
dc.typePHD thesis
dc.contributor.imecauthorStockman, Arno
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorBakeroot, Benoit
dc.contributor.thesisadvisorDoutreloigne, Jan
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
46861.pdf
Size:
9.501Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record