dc.contributor.author | Vanstreels, Kris | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Gonzalez, Mario | |
dc.date.accessioned | 2021-10-29T06:51:25Z | |
dc.date.available | 2021-10-29T06:51:25Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36214 | |
dc.source | IIOimport | |
dc.title | Impact of Back-End-Of-Line architecture on chip-package-interaction in advanced interconnects | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vanstreels, Kris | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.orcidimec | Vanstreels, Kris::0000-0002-4420-0966 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113825-1 | |
dc.source.endpage | 113825-9 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.volume | 112 | |
dc.identifier.url | https://doi.org/10.1016/j.microrel.2020.113825 | |
imec.availability | Published - imec | |