Show simple item record

Defect-Based Compact Modeling of Random Telegraph Noise

dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorSimicic, Marko
dc.contributor.authorParvais, Bertrand
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-29T07:54:27Z
dc.date.available2021-10-29T07:54:27Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36311
dc.sourceIIOimport
dc.titleDefect-Based Compact Modeling of Random Telegraph Noise
dc.typeBook chapter
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage517
dc.source.bookNoise in Nanoscale Semiconductor Devices
dc.source.endpage552
dc.identifier.urlhttps://doi.org/10.1007/978-3-030-37500-3_16
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record