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dc.contributor.authorChen, Shih-Hung
dc.date.accessioned2021-10-31T08:12:46Z
dc.date.available2021-10-31T08:12:46Z
dc.date.issued2021
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36565
dc.sourceIIOimport
dc.titleNext to FinFET, how will ESD suffer?
dc.typeJournal article
dc.contributor.imecauthorChen, Shih-Hung
dc.source.peerreviewno
dc.source.journalIn Compliance Magazine
dc.source.issueJuly
dc.identifier.urlhttps://incompliancemag.com/article/next-to-finfet-how-will-esd-suffer/
imec.availabilityPublished - imec


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