Next to FinFET, how will ESD suffer?
dc.contributor.author | Chen, Shih-Hung | |
dc.date.accessioned | 2021-10-31T08:12:46Z | |
dc.date.available | 2021-10-31T08:12:46Z | |
dc.date.issued | 2021 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36565 | |
dc.source | IIOimport | |
dc.title | Next to FinFET, how will ESD suffer? | |
dc.type | Journal article | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.source.peerreview | no | |
dc.source.journal | In Compliance Magazine | |
dc.source.issue | July | |
dc.identifier.url | https://incompliancemag.com/article/next-to-finfet-how-will-esd-suffer/ | |
imec.availability | Published - imec |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |