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Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images

dc.contributor.authorDe Backer, Annick
dc.contributor.authorFatermans, Jarmo
dc.contributor.authorden Dekker, Arnold
dc.contributor.authorVan Aert, Sandra
dc.date.accessioned2021-10-31T08:18:04Z
dc.date.available2021-10-31T08:18:04Z
dc.date.issued2021
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36602
dc.sourceIIOimport
dc.titleChapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images
dc.typeBook chapter
dc.contributor.imecauthorden Dekker, Arnold
dc.identifier.doi10.1016/bs.aiep.2021.01.005
dc.source.peerreviewyes
dc.source.beginpage145
dc.source.bookAdvances in Imaging and Electron Physics
dc.source.endpage175
dc.identifier.urlhttps://doi.org/10.1016/bs.aiep.2021.01.005
imec.availabilityPublished - imec


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