| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Gielen, Georges | |
| dc.contributor.author | Stucchi, Michele | |
| dc.contributor.author | V "at "ajelu, Elena-Ioana | |
| dc.date.accessioned | 2021-10-31T09:45:32Z | |
| dc.date.available | 2021-10-31T09:45:32Z | |
| dc.date.issued | 2021-05 | |
| dc.identifier.issn | 1879-6443 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36951 | |
| dc.source | IIOimport | |
| dc.title | Hot topics in IC and electronic system testing – from all angles | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Gielen, Georges | |
| dc.contributor.imecauthor | Stucchi, Michele | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 1 | |
| dc.source.endpage | 8 | |
| dc.source.journal | Bits and Chips | |
| dc.identifier.url | https://bits-chips.nl/artikel/hot-topics-in-ic-and-electronic-system-testing-from-all-angles/ | |
| imec.availability | Published - imec | |
