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Confocal microscopy and spectroscopy of InGaN epilayers on sapphire

dc.contributor.authorO'Donnell, K. P.
dc.contributor.authorTobin, M. J.
dc.contributor.authorBayliss, S. C.
dc.contributor.authorVan der Stricht, Wim
dc.date.accessioned2021-10-14T11:32:17Z
dc.date.available2021-10-14T11:32:17Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3715
dc.sourceIIOimport
dc.titleConfocal microscopy and spectroscopy of InGaN epilayers on sapphire
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage105
dc.source.endpage108
dc.source.journalJournal of Microscopy
dc.source.issue2
dc.source.volume193
imec.availabilityPublished - open access


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