dc.contributor.author | Ohyama, Hidenori | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Hayama, Kiyoteru | |
dc.contributor.author | Tokuyama, J. | |
dc.contributor.author | Takami, Y. | |
dc.contributor.author | Sunaga, H. | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Caymax, Matty | |
dc.date.accessioned | 2021-10-14T11:32:46Z | |
dc.date.available | 2021-10-14T11:32:46Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3725 | |
dc.source | IIOimport | |
dc.title | Radiation damage in Si1-xGex heteroepitaxial devices | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 351 | |
dc.source.endpage | 355 | |
dc.source.journal | Journal of Radioanalytical and Nuclear Chemistry | |
dc.source.issue | 2 | |
dc.source.volume | 239 | |
imec.availability | Published - open access | |