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dc.contributor.authorNeupane, Shova
dc.contributor.authorValencia-Ramirez, Andrea
dc.contributor.authorLosada-Perez, Patricia
dc.contributor.authorRenner, Frank Uwe
dc.date.accessioned2021-11-02T15:55:16Z
dc.date.available2021-11-02T15:55:16Z
dc.date.issued2021-OCT 19
dc.identifier.issn1862-6300
dc.identifier.otherWOS:000708574300001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37444
dc.sourceWOS
dc.titleIn Operando Atomic Force Microscopy Imaging of Electrochemical Interfaces: A Short Perspective
dc.typeJournal article
dc.contributor.imecauthorNeupane, Shova
dc.contributor.imecauthorValencia-Ramirez, Andrea
dc.contributor.imecauthorLosada-Perez, Patricia
dc.contributor.imecauthorRenner, Frank Uwe
dc.identifier.doi10.1002/pssa.202100470
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.journalPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
imec.availabilityUnder review


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