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On the dielectric material properties for thin film integrated RF and microwave applications

dc.contributor.authorPieters, Philip
dc.contributor.authorBrebels, Steven
dc.contributor.authorCarchon, Geert
dc.contributor.authorVaesen, Kristof
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorBeyne, Eric
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-10-14T11:33:53Z
dc.date.available2021-10-14T11:33:53Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3748
dc.sourceIIOimport
dc.titleOn the dielectric material properties for thin film integrated RF and microwave applications
dc.typeJournal article
dc.contributor.imecauthorPieters, Philip
dc.contributor.imecauthorBrebels, Steven
dc.contributor.imecauthorVaesen, Kristof
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecBrebels, Steven::0000-0002-1568-0286
dc.contributor.orcidimecVaesen, Kristof::0000-0001-9971-3593
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage19
dc.source.endpage23
dc.source.journalAdvancing Microelectronics
dc.source.issueSept_Oct
dc.source.volume26
imec.availabilityPublished - open access


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