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Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
dc.contributor.author | Diaz-Fortuny, Javier | |
dc.contributor.author | Saraza-Canflanca, Pablo | |
dc.contributor.author | Rodriguez, Rosana | |
dc.contributor.author | Martin-Martinez, Javier | |
dc.contributor.author | Castro-Lopez, Rafael | |
dc.contributor.author | Roca, Elisenda | |
dc.contributor.author | V. Fernandez, Francisco | |
dc.contributor.author | Nafria, Montserrat | |
dc.date.accessioned | 2021-11-02T15:56:36Z | |
dc.date.available | 2021-11-02T15:56:36Z | |
dc.date.issued | 2021-NOV | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000701908200013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37527 | |
dc.source | WOS | |
dc.title | Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions | |
dc.type | Journal article | |
dc.identifier.doi | 10.1016/j.sse.2021.108037 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.volume | 185 | |
imec.availability | Under review |
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