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Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress
dc.contributor.author | Lee, Kookjin | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Kruv, Anastasiia | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Tyaginov, Stanislav | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2021-11-02T15:56:37Z | |
dc.date.available | 2021-11-02T15:56:37Z | |
dc.date.issued | 2021-OCT | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000701249800007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37530 | |
dc.source | WOS | |
dc.title | Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lee, Kookjin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Kruv, Anastasiia | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Tyaginov, Stanislav | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Lee, Kookjin::0000-0002-9896-1090 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.identifier.doi | 10.1109/LED.2021.3104885 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1424 | |
dc.source.endpage | 1427 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 10 | |
dc.source.volume | 42 | |
imec.availability | Under review |
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