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Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
dc.contributor.author | Min, Jinhong | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | McMitchell, Sean R. C. | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Banerjee, Kaustuv | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Shin, Changhwan | |
dc.date.accessioned | 2021-11-02T15:57:28Z | |
dc.date.available | 2021-11-02T15:57:28Z | |
dc.date.issued | 2021-SEP | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000690440900010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37611 | |
dc.source | WOS | |
dc.title | Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor | |
dc.type | Journal article | |
dc.contributor.imecauthor | Min, Jinhong | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | McMitchell, Sean R. C. | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Banerjee, Kaustuv | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.identifier.doi | 10.1109/LED.2021.3102592 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1280 | |
dc.source.endpage | 1283 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 9 | |
dc.source.volume | 42 | |
imec.availability | Under review |
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