dc.contributor.author | Ali, T. | |
dc.contributor.author | Kuehnel, K. | |
dc.contributor.author | Czernohorsky, M. | |
dc.contributor.author | Rudolph, M. | |
dc.contributor.author | Paetzold, B. | |
dc.contributor.author | Olivo, R. | |
dc.contributor.author | Lehninger, D. | |
dc.contributor.author | Mertens, K. | |
dc.contributor.author | Mueller, F. | |
dc.contributor.author | Lederer, M. | |
dc.contributor.author | Hoffmann, R. | |
dc.contributor.author | Mart, C. | |
dc.contributor.author | Kalkani, M. N. | |
dc.contributor.author | Steinke, P. | |
dc.contributor.author | Kaempfe, T. | |
dc.contributor.author | Mueller, J. | |
dc.contributor.author | Seidel, K. | |
dc.contributor.author | Eng, L. M. | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-12-02T15:39:40Z | |
dc.date.available | 2021-11-02T15:57:33Z | |
dc.date.available | 2021-12-02T15:39:40Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200040 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37616.2 | |
dc.source | WOS | |
dc.title | Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van Houdt, J. | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidext | Lederer, M.::0000-0002-1739-2747 | |
dc.contributor.orcidext | Kaempfe, T.::0000-0002-4672-8676 | |
dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
dc.source.conferencelocation | Dallas, TX, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |