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Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching
dc.contributor.author | Lanza, Mario | |
dc.contributor.author | Palumbo, Felix | |
dc.contributor.author | Shi, Yuanyuan | |
dc.contributor.author | Aguirre, Fernando | |
dc.contributor.author | Boyeras, Santiago | |
dc.contributor.author | Yuan, Bin | |
dc.contributor.author | Yalon, Eilam | |
dc.contributor.author | Moreno, Enrique | |
dc.contributor.author | Wu, Tianru | |
dc.contributor.author | Roldan, Juan B. | |
dc.date.accessioned | 2021-11-02T15:57:53Z | |
dc.date.available | 2021-11-02T15:57:53Z | |
dc.date.issued | 2021-AUG 12 | |
dc.identifier.issn | 2199-160X | |
dc.identifier.other | WOS:000684421000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37643 | |
dc.source | WOS | |
dc.title | Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching | |
dc.type | Journal article | |
dc.contributor.imecauthor | Shi, Yuanyuan | |
dc.contributor.orcidext | Aguirre, Fernando::0000-0001-7793-1194 | |
dc.contributor.orcidext | Moreno, Enrique::0000-0002-5304-1311 | |
dc.contributor.orcidimec | Shi, Yuanyuan::0000-0002-4836-6752 | |
dc.identifier.doi | 10.1002/aelm.202100580 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.journal | ADVANCED ELECTRONIC MATERIALS | |
imec.availability | Under review |
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