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Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators

dc.contributor.authorTsiara, Artemisia
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorBalakrishnan, Sadhishkumar
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorAbsil, Philippe
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.date.accessioned2021-12-08T10:23:49Z
dc.date.available2021-11-02T15:57:54Z
dc.date.available2021-12-08T10:23:49Z
dc.date.issued2020
dc.identifier.issnna
dc.identifier.otherWOS:000676346200057
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37646.2
dc.sourceWOS
dc.titleElectrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
dc.typeProceedings paper
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.embargo2020-03-11
dc.identifier.eisbn978-1-9435-8071-2
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.conferenceOptical Fiber Communications Conference and Exposition (OFC)
dc.source.conferencedateMAR 08-12, 2020
dc.source.conferencelocationSan Diego
dc.source.journalna
imec.availabilityPublished - open access


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220.500.12860/37646.2*2021-12-08T10:20:20Zvalidation by library/open access desk
120.500.12860/376462021-11-02T15:57:54Z

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