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Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators

dc.contributor.authorTsiara, A.
dc.contributor.authorSrinivasan, S. A.
dc.contributor.authorBalakrishnan, S.
dc.contributor.authorPantouvaki, M.
dc.contributor.authorAbsil, Ph
dc.contributor.authorVan Campenhout, J.
dc.contributor.authorCroes, K.
dc.date.accessioned2021-11-02T15:57:54Z
dc.date.available2021-11-02T15:57:54Z
dc.date.issued2020
dc.identifier.otherWOS:000676346200057
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37646
dc.sourceWOS
dc.titleElectrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
dc.typeProceedings paper
dc.contributor.imecauthorTsiara, A.
dc.contributor.imecauthorSrinivasan, S. A.
dc.contributor.imecauthorBalakrishnan, S.
dc.contributor.imecauthorPantouvaki, M.
dc.contributor.imecauthorAbsil, Ph
dc.contributor.imecauthorVan Campenhout, J.
dc.contributor.imecauthorCroes, K.
dc.identifier.eisbn978-1-9435-8071-2
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.conferenceOptical Fiber Communications Conference and Exposition (OFC)
dc.source.conferencedateMAR 08-12, 2020
dc.source.conferencelocationSan Diego
imec.availabilityUnder review


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220.500.12860/37646.22021-12-08T10:20:20Zvalidation by library/open access desk
120.500.12860/37646*2021-11-02T15:57:54Z

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