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Understanding of Tunable Selector Performance in Si-Ge-As-Se OTS Devices by Extended Percolation Cluster Model Considering Operation Scheme and Material Design

dc.contributor.authorKim, W. G.
dc.contributor.authorPakala, M.
dc.contributor.authorKabuyanagi, Shoichi
dc.contributor.authorGarbin, Daniele
dc.contributor.authorFantini, Andrea
dc.contributor.authorClima, Sergiu
dc.contributor.authorDegraeve, Robin
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorDevulder, Wouter
dc.contributor.authorDelhougne, Romain
dc.contributor.authorCellier, Daniel
dc.contributor.authorCockburn, Andrew
dc.contributor.authorSuzuki, Masamichi
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-12-06T11:22:28Z
dc.date.available2021-11-02T15:59:10Z
dc.date.available2021-12-06T11:22:28Z
dc.date.issued2020
dc.identifier.issn0743-1562
dc.identifier.otherWOS:000668063000004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37748.2
dc.sourceWOS
dc.titleUnderstanding of Tunable Selector Performance in Si-Ge-As-Se OTS Devices by Extended Percolation Cluster Model Considering Operation Scheme and Material Design
dc.typeProceedings paper
dc.contributor.imecauthorKabuyanagi, S.
dc.contributor.imecauthorGarbin, D.
dc.contributor.imecauthorFantini, A.
dc.contributor.imecauthorClima, S.
dc.contributor.imecauthorDegraeve, R.
dc.contributor.imecauthorDonadio, G. L.
dc.contributor.imecauthorDevulder, W.
dc.contributor.imecauthorDelhougne, R.
dc.contributor.imecauthorSuzuki, M.
dc.contributor.imecauthorGoux, L.
dc.contributor.imecauthorKar, G. S.
dc.contributor.imecauthorKabuyanagi, Shoichi
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorCellier, Daniel
dc.contributor.imecauthorCockburn, Andrew
dc.contributor.imecauthorSuzuki, Masamichi
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.identifier.eisbn978-1-7281-6460-1
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.conferenceIEEE Symposium on VLSI Technology and Circuits
dc.source.conferencedateJUN 15-19, 2020
dc.source.conferencelocationHonolulu, HI, USA
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/37748.2*2021-12-06T11:16:18Zvalidation by library/open access desk
120.500.12860/377482021-11-02T15:59:10Z

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