dc.contributor.author | Koladi Mootheri, Vivek | |
dc.contributor.author | Wu, Xiangyu | |
dc.contributor.author | Cott, Daire | |
dc.contributor.author | Groven, Benjamin | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Asselberghs, Inge | |
dc.contributor.author | Radu, Iuliana | |
dc.contributor.author | Lin, Dennis | |
dc.date.accessioned | 2023-01-05T14:31:06Z | |
dc.date.available | 2021-11-02T15:59:51Z | |
dc.date.available | 2023-01-05T14:31:06Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000672563600014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37791.2 | |
dc.source | WOS | |
dc.title | Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profile | |
dc.type | Journal article | |
dc.contributor.imecauthor | Koladi Mootheri, Vivek | |
dc.contributor.imecauthor | Wu, Xiangyu | |
dc.contributor.imecauthor | Cott, Daire | |
dc.contributor.imecauthor | Groven, Benjamin | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Asselberghs, Inge | |
dc.contributor.imecauthor | Radu, Iuliana | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.orcidimec | Groven, Benjamin::0000-0002-5781-7594 | |
dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
dc.contributor.orcidimec | Koladi Mootheri, Vivek::0000-0002-1373-8405 | |
dc.identifier.doi | 10.1016/j.sse.2021.108035 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 108035 | |
dc.source.endpage | na | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.issue | na | |
dc.source.volume | 183 | |
imec.availability | Published - imec | |