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dc.contributor.authorGupta, Sandeep
dc.contributor.authorBuriro, Attaullah
dc.contributor.authorCrispo, Bruno
dc.date.accessioned2021-11-24T09:42:54Z
dc.date.available2021-11-02T16:01:31Z
dc.date.available2021-11-24T09:42:54Z
dc.date.issued2020
dc.identifier.isbn978-3-030-39748-7
dc.identifier.issn0302-9743
dc.identifier.otherWOS:000655496500010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37904.2
dc.sourceWOS
dc.titleA Risk-Driven Model to Minimize the Effects of Human Factors on Smart Devices
dc.typeProceedings paper
dc.contributor.orcidextGupta, Sandeep::0000-0001-9220-7700
dc.identifier.doi10.1007/978-3-030-39749-4_10
dc.identifier.eisbn978-3-030-39749-4
dc.source.numberofpages15
dc.source.peerreviewyes
dc.source.beginpage156
dc.source.endpage170
dc.source.conference2nd International Workshop on Emerging Technologies for Authorization and Authentication (ETAA)
dc.source.conferencedateSEP 27, 2019
dc.source.conferencelocationLuxembourg
dc.source.journalna
dc.source.volume11967
imec.availabilityPublished - imec


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