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An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors
dc.contributor.author | Chien, Yu-Chieh | |
dc.contributor.author | Londono Ramirez, Horacio | |
dc.contributor.author | Kuo, Chuan-Wei | |
dc.contributor.author | Tsao, Yu-Ching | |
dc.contributor.author | Nag, Manoj | |
dc.contributor.author | Chang, Ting-Chang | |
dc.contributor.author | Ang, Kah-Wee | |
dc.date.accessioned | 2021-11-02T16:01:31Z | |
dc.date.available | 2021-11-02T16:01:31Z | |
dc.date.issued | 2021-JUN | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000652799800019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37909 | |
dc.source | WOS | |
dc.title | An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Londono Ramirez, Horacio | |
dc.contributor.imecauthor | Nag, Manoj | |
dc.contributor.orcidext | Chien, Yu-Chieh::0000-0002-8491-6483 | |
dc.contributor.orcidimec | Londono Ramirez, Horacio::0000-0003-3456-8975 | |
dc.identifier.doi | 10.1109/TED.2021.3072878 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2717 | |
dc.source.endpage | 2722 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 6 | |
dc.source.volume | 68 | |
imec.availability | Under review |
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